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Conference contributions
Early resistance change and stress/electromigration modeling in aluminum interconnects
Publication:
Early resistance change and stress/electromigration modeling in aluminum interconnects
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Date
1997
Proceedings Paper
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2062.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Petrescu, Violeta
;
Mouthaan, A. J.
;
Schoenmaker, Wim
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2063
since deposited on 2021-09-30
Acq. date: 2025-12-10
Citations
Metrics
Views
2063
since deposited on 2021-09-30
Acq. date: 2025-12-10
Citations