Publication:

Early resistance change and stress/electromigration modeling in aluminum interconnects

Date

1997

Proceedings Paper

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Files

2062.pdf 250.77 KB

Author(s)

Petrescu, Violeta

;

Mouthaan, A. J.

;

Schoenmaker, Wim

Statistics

2063 since deposited on 2021-09-30

Acq. date: 2026-01-26