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Browsing by Author "Mura, G."

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    A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps

    Meneghini, M.
    ;
    Bertin, M.
    ;
    Dal Santo, G.
    ;
    Stocco, A.
    ;
    Chini, A.
    ;
    Marcon, Denis  
    ;
    Malinowski, Pawel  
    Proceedings paper
    2012, International Electron Devices Meeting - IEDM, 10/12/2012, p.13.3

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