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A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps
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A novel degradation mechanism of AlGaN/GaN/Silicon heterostructures related to the generation of interface traps
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Date
2012
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Meneghini, M.
;
Bertin, M.
;
Dal Santo, G.
;
Stocco, A.
;
Chini, A.
;
Marcon, Denis
;
Malinowski, Pawel
;
Mura, G.
;
Musu, E.
;
Vanzi, M.
;
Meneghesso, G.
;
Zanoni, E.
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1991
since deposited on 2021-10-20
2
last month
Acq. date: 2025-12-11
Citations
Metrics
Views
1991
since deposited on 2021-10-20
2
last month
Acq. date: 2025-12-11
Citations