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Browsing by Author "Nakabayashi, T."

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    Impact of advanced gate stack engineering on low frequency noise performances of planar bulk CMOS transistors

    Mercha, Abdelkarim  
    ;
    Okawa, H.
    ;
    Akheyar, Amal
    ;
    Simoen, Eddy  
    ;
    Nakabayashi, T.
    ;
    Hoffmann, Thomas Y.
    Proceedings paper
    2009, 20th International Conference on Noise and Fluctuations - ICNF, 14/06/2009, p.277-280

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