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Impact of advanced gate stack engineering on low frequency noise performances of planar bulk CMOS transistors
Publication:
Impact of advanced gate stack engineering on low frequency noise performances of planar bulk CMOS transistors
Date
2009
Proceedings Paper
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17817.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mercha, Abdelkarim
;
Okawa, H.
;
Akheyar, Amal
;
Simoen, Eddy
;
Nakabayashi, T.
;
Hoffmann, Thomas Y.
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1945
since deposited on 2021-10-18
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last month
1
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Acq. date: 2025-12-08
Citations
Metrics
Views
1945
since deposited on 2021-10-18
3
last month
1
last week
Acq. date: 2025-12-08
Citations