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Browsing by Author "Nakaei, Takumi"

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    Faster ESD device characterization with wafer-level HBM

    Scholz, Mirko
    ;
    Tremouilles, David
    ;
    Linten, Dimitri  
    ;
    Rolain, Yves
    ;
    Pintelon, Rik
    Proceedings paper
    2007, 20th IEEE International Conference on Microelectronic Test Structures - ICMTS, 19/03/2007, p.93-96

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