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Browsing by Author "Nanakoudis, Antonis"

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    Correlative 3D strain analysis in nanometer-sized semiconductor devices by precession electron diffraction, raman spectroscopy and FE simulations

    Nanakoudis, Antonis
    ;
    Nuytten, Thomas  
    ;
    Bender, Hugo  
    ;
    Vandervorst, Wilfried  
    ;
    Bals, Sara
    Proceedings paper
    2017, Microscopy of Semiconducting Materials - MSM XX, 9/04/2017

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