Browsing by Author "Nanakoudis, Antonis"
Now showing 1 - 1 of 1
- Results Per Page
- Sort Options
Publication Correlative 3D strain analysis in nanometer-sized semiconductor devices by precession electron diffraction, raman spectroscopy and FE simulations
Proceedings paper2017, Microscopy of Semiconducting Materials - MSM XX, 9/04/2017