Browsing by Author "Nardo, A."
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Publication ESD-failure of E-mode GaN HEMTs: role of device geometry and charge trapping
; Banerjee, A.Journal article2019, Microelectronics Reliability, 100, p.113334Publication Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors
Proceedings paper2019, 2019 IEEE International Reliability Physics Symposium (IRPS), 31/03/2019, p.1-6