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Browsing by Author "Nellist, Peter D."

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    Single atom detection from low contrast-to-noise ratio electron microscopy images

    Fatermans, J.
    ;
    den Dekker, Arnold Jan
    ;
    Müller-Caspary, K.
    ;
    Lobato, Ivan
    ;
    O'Leary, C. M.
    Journal article
    2018-07, Physical Review Letters, (121) 5, p.56101
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    The Effect of Dynamical Scattering on Single-plane Phase Retrieval in Electron Ptychography

    Clark, Laura
    ;
    Martinez Alanis, Gerardo Tadeo  
    ;
    OLeary, Colum M.
    ;
    Yang, Hao
    ;
    Ding, Zhiyuan
    Journal article
    2023, MICROSCOPY AND MICROANALYSIS, (29) 1, p.384-394

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