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Browsing by Author "Neri, B."

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    Origin of the substrate current after soft-breakdown in thin oxide n-MOSFETs

    Crupi, Felice
    ;
    Iannaccone, G.
    ;
    Neri, B.
    ;
    Crupi, Isodiana
    ;
    Degraeve, Robin  
    ;
    Groeseneken, Guido  
    Proceedings paper
    1999, IFPA '99 - Proceedings of the 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits;, p.77-80

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