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Origin of the substrate current after soft-breakdown in thin oxide n-MOSFETs
Publication:
Origin of the substrate current after soft-breakdown in thin oxide n-MOSFETs
Date
1999
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Crupi, Felice
;
Iannaccone, G.
;
Neri, B.
;
Crupi, Isodiana
;
Degraeve, Robin
;
Groeseneken, Guido
;
Maes, Herman
Journal
Abstract
Description
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Views
1990
since deposited on 2021-10-06
419
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1990
since deposited on 2021-10-06
419
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations