Browsing by Author "Neviani, A."

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Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs

Modolo, N.
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Fregolent, M.
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Masin, F.
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Benato, A.
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Bettini, A.
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Buffolo, M.
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De Santi, C.
;
Borga, Matteo
Journal article
2022, MICROELECTRONICS RELIABILITY, (138) November, p.Art. 120560B
Compact Modeling of Nonideal Trapping/Detrapping Processes in GaN Power Devices

Modolo, N.
;
De Santi, C.
;
Baratella, Giulio
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Bettini, A.
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Borga, Matteo
;
Posthuma, Niels
Journal article
2022, IEEE TRANSACTIONS ON ELECTRON DEVICES, (69) 8, p.4432-4437