Browsing by Author "Nguyen, B.-Y."
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Publication A novel low-voltage biasing scheme for double gate FBC achieving 5s retention and 10^16 endurance at 85°C
Proceedings paper2010, IEEE International Elecrton Devices Meeting - IEDM, 6/12/2010, p.288-291Publication Analysis of sense margin and reliability of 1T-DRAM fabricated on thin-film UTBOX substrates
Proceedings paper2009, IEEE International SOI Conference, 5/10/2009Publication Reliability and retention of 1T-RAM cell capacitor less on UTBOX SOI substrates
Proceedings paper2010, International SOI Conference, 11/10/2010, p.129-130