Browsing by Author "Nicoletti, T."
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Publication Analysis of the total resistance in standard and strained FinFET devices with and without the u se of SEG
Proceedings paper2009, 24th Symposium on Microelectronics Technology and Devices - SBMicro, 31/08/2009, p.575-582Publication Comparison between low and high read bias in FB-RAM on UTBOX FDSOI devices
Publication Gate length impact on UTBOX FBRAM devices
Proceedings paper2012, IEEE International SOI Conference, 1/10/2012, p.4.3Publication Rotated SOI MuGFETs at high temperatures
Proceedings paper2011, 7th Workshop of the Thematic Network on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI, 17/01/2011, p.83-84Publication Spacer length and tilt implantation influence on scaled UTBOX FD MOSFETs
Proceedings paper2012, Proceedings of the 27th Symposium on Microelectronics Technology and Devices - SBMicro, 30/08/2012, p.483-489Publication Study of the main digital and analog parameters of underlappedMuGFETs
Proceedings paper2012, 8th European Workshop on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI, 24/01/2012, p.123-124Publication Temperature activation of UTBOX SOI device characteristics with different source/drain engineering
Proceedings paper2012, 8th European Workshop on Silicon-on-Insulator Technology, Devices and Circuits - EUROSOI, 24/01/2012, p.61-62Publication The activation energy dependence on the electric field in UTBOX SOI FBRAM devices
Proceedings paper2013, IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference, 7/10/2013, p.7.8Publication The impact of gate length scaling on UTBOX FDSOI devices: the digital/analog performance of extension-less structures
Proceedings paper2012, 13th International Conference on ULtimate Integration on Silicon - ULIS, 5/03/2012, p.161-164