Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Analysis of the total resistance in standard and strained FinFET devices with and without the u se of SEG
Publication:
Analysis of the total resistance in standard and strained FinFET devices with and without the u se of SEG
Date
2009
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
19272.pdf
187.04 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nicoletti, T.
;
Martino, J.A.
;
Simoen, Eddy
;
Claeys, Cor
Journal
Abstract
Description
Metrics
Views
1893
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-08
Citations
Metrics
Views
1893
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-08
Citations