Browsing by Author "Nieddu, Thomas"
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Publication Bandgap measurement by spectroscopic ellipsometry for strained Ge 1-x Sn x
Proceedings paper2013-06, 8th International conference on Silicon Epitaxy and Heterostructures - ICSI-8, 2/06/2013, p.65-66Publication Composition and thickness dependence of GeSn growth by chemical vapor deposition
Publication Theoretical and experimental investigation of the GeSn bandgap
Meeting abstract2013, E-MRS 2013 Fall Meeting, 16/09/2013