Browsing by Author "Niehuis, Ewald"
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Publication In-situ ToF-SIMS and SFM measurements of inorganic semiconductor materials
Oral presentation2016, SIMS EuropePublication Sputtering with large On+ cluster projectiles on inorganic surfaces
Meeting abstract2015, SIMS XX, 13/09/2015Publication Surface analysis in the semiconductor industry: Present use and future possibilities
Journal article2020, Surface and Interface Analysis, (52) 12, p.786-791