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Browsing by Author "Nijmeijer, R."

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    Junction and profile analysis using carrier illumination

    Clarysse, Trudo
    ;
    Vandervorst, Wilfried  
    ;
    Lindsay, Richard
    ;
    Borden, P.
    ;
    Budiarto, E.
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    Madsen, J.
    Proceedings paper
    2002, Silicon Front-End Junction Formation Technologies, 1/04/2002, p.285-290
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    Progress towards an electrically active, ultra-shallow junction depth reference for carrier illumination, SRP and SIMS

    Borden, P.
    ;
    Bechtler, L.
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    Klemme, B.
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    Nijmeijer, R.
    ;
    Judge, E.
    ;
    Diebold, A.
    ;
    Bennett, J.
    Proceedings paper
    2001, 6th Int. Workshop on Fabrication, Characterization and Modeling of Ultra-Shallow Doping Profiles in Semiconductors - USJ, 22/04/2001, p.161-167

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