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Browsing by Author "Noori, Atif"

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    Integration of 20nm half pitch single damascene copper trenches by spacer-defined double patterning (SDDP) on metal hard mask (MHM)

    Siew, Yong Kong  
    ;
    Versluijs, Janko  
    ;
    Kunnen, Eddy
    ;
    Ciofi, Ivan  
    ;
    Alaerts, Wilfried  
    ;
    Dekkers, Harold  
    Proceedings paper
    2010, IEEE International Interconnect Technology Conference - IITC, 7/06/2010
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    Manufacturable processes for =32-nm-node CMOS enhancement by synchronous optimization of strain-engineered channel and external parasitic resistances

    Noori, Atif
    ;
    Balseanu, Mihaela
    ;
    Boelen, Pieter
    ;
    Cockburn, Andrew  
    ;
    Demuynck, Steven  
    ;
    Felch, Susan
    Journal article
    2008, IEEE Transactions on Electron Devices, (55) 5, p.1259-1264
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    Spacer defined double patterning for 20nm half pitch interconnect damascene structures

    Siew, Yong Kong  
    ;
    Cockburn, Andrew  
    ;
    Beyer, Gerald  
    ;
    Versluijs, Janko  
    ;
    Kunnen, Eddy
    ;
    Dekkers, Harold  
    Oral presentation
    2010, Applied Materials Engineering Technology Conference

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