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Browsing by Author "O'Neil, A.G."

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    Strained Si/SiGe MOS technology: improving gate dielectric integrity

    Olsen, S.H.
    ;
    Yan, L.
    ;
    Agaiby, R.
    ;
    Escobedo-Cousin, A.G.
    ;
    O'Neil, A.G.
    ;
    Hellstrom, P.E.
    ;
    Ostling, M.
    Journal article
    2009, Microelectronic Engineering, (86) 3, p.218-223

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