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Browsing by Author "O'Neill, A.G"

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    Insight into the aggravated lifetime reliability in advanced MOSFETs with strained Si channels on SiGe strain relaxed buffers due to self-heating

    Agaiby, R.
    ;
    O'Neill, A.G
    ;
    Olsen, S.H
    ;
    Eneman, Geert  
    ;
    Verheyen, Peter  
    ;
    Loo, Roger  
    ;
    Claeys, Cor
    Journal article
    2008, IEEE Transactions on Electron Devices, (55) 6, p.1568-1573

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