Publication:
Insight into the aggravated lifetime reliability in advanced MOSFETs with strained Si channels on SiGe strain relaxed buffers due to self-heating
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1938 since deposited on 2021-10-17
1last month
Acq. date: 2025-12-12
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Metrics
Views
1938 since deposited on 2021-10-17
1last month
Acq. date: 2025-12-12
Citations