Publication:
Insight into the aggravated lifetime reliability in advanced MOSFETs with strained Si channels on SiGe strain relaxed buffers due to self-heating
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1935 since deposited on 2021-10-17
Acq. date: 2025-10-25
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1935 since deposited on 2021-10-17
Acq. date: 2025-10-25
Citations