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Browsing by Author "Ogle, B."

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    Electrical properties of thin SiON/Ta2O5 gate dielectric stacks

    Houssa, Michel  
    ;
    Degraeve, Robin  
    ;
    Mertens, Paul  
    ;
    Heyns, Marc  
    ;
    Jeon, J. S.
    ;
    Halliyal, A.
    ;
    Ogle, B.
    Journal article
    1999, J. Appl. Phys., (86) 11, p.6462-6467
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    Evaluation of cleaning recipes based on ozonated water for pre-gate oxide cleaning

    Jeon, J. S.
    ;
    Ogle, B.
    ;
    Baeyens, Martien
    ;
    Mertens, Paul  
    Proceedings paper
    1999, Ultra Clean Processing of Silicon Surfaces; Proceedings of the 4th International Symposium on Ultra Clean Processing of Silicon, 21/09/1998, p.119-122
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    Evaluation of cleaning recipes based on ozonated water for pre-gate oxide cleaning

    Jeon, J. S.
    ;
    Ogle, B.
    ;
    Baeyens, Martien
    ;
    Mertens, Paul  
    Oral presentation
    1998, 4th International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS
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    Soft breakdown in very thin Ta2 O5 gate dielectric layers

    Houssa, Michel  
    ;
    Mertens, Paul  
    ;
    Heyns, Marc  
    ;
    Heon, J. S.
    ;
    Halliyal, A.
    ;
    Ogle, B.
    Journal article
    2000, Solid-State Electronics, (44) 3, p.521-525

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