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Browsing by Author "Ohkubo, Tadakatsu"

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    Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography

    Uedono, Akira
    ;
    Fleischmann, Claudia  
    ;
    Soulie, Jean-Philippe  
    ;
    Ayyad, Mustafa  
    ;
    Scheerder, Jeroen  
    Journal article
    2024, ACS APPLIED ELECTRONIC MATERIALS, (6) 8, p.5894-5902

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