Publication:
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
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704 since deposited on 2024-08-07
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Acq. date: 2026-08-10
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Statistics
Views
704 since deposited on 2024-08-07
5last month
3last week
Acq. date: 2026-08-10
Citations