Publication:
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
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694 since deposited on 2024-08-07
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Acq. date: 2026-01-26
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Statistics
Views
694 since deposited on 2024-08-07
1last month
1last week
Acq. date: 2026-01-26
Citations