Browsing by Author "Olsen, Sarah"
Now showing 1 - 2 of 2
- Results Per Page
- Sort Options
Publication Direct measurement of MOSFET channel strain by means of backside etching and Raman spectroscopy on long-channel devices
Journal article2010, IEEE Electron Device Letters, (31) 5, p.419-421Publication Reduced self-heating by strained silicon substrate engineering