Browsing by Author "Olsson, J."
Now showing 1 - 2 of 2
- Results Per Page
- Sort Options
Publication Metal gate work function extraction using Fowler-Nordheim tunneling techniques
Journal article2005, Microelectronic Engineering, 80, p.280-283Publication On the thermal stability of atomic layer deposited TiN as gate electrode in MOS devices
Journal article2003, IEEE Electron Device Letters, (24) 9, p.550-552