Browsing by Author "Ono, Makoto"
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Publication A fully-integrated method for RTN parameter extraction
; ; ; ; ; Sawada, KenProceedings paper2017, Symposium on VLSI Technology, 5/06/2017, p.132-133Publication Defect-based compact modeling for RTN and BTI variability
Proceedings paper2017, IEEE International Reliability Physics Symposium - IRPS, 2/04/2017, p.CR-7.1-CR-7.6