Publication:

Defect-based compact modeling for RTN and BTI variability

Date

2017

Proceedings Paper

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Files

34893.pdf 1.37 MB

Author(s)

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Parvais, Bertrand

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Raghavan, Praveen

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Linten, Dimitri

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Yamakawa, Shinya

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Spessot, Alessio

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Verkest, Diederik

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Statistics

1920 since deposited on 2021-10-24

Acq. date: 2026-01-25