Browsing by Author "Onodera, Hidetoshi"
Now showing 1 - 1 of 1
- Results per page
- Sort Options
Publication Physical-based RTN modeling of ring oscillators in 40-nm SiON and 28-nm HKMG by bimodal defect-centric behaviors
Proceedings paper2016, 21st International Conference on Simulation of Semiconductor Processes and Process - SISPAD, 13/06/2016, p.327-330