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Browsing by Author "Onodera, Hidetoshi"

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    Physical-based RTN modeling of ring oscillators in 40-nm SiON and 28-nm HKMG by bimodal defect-centric behaviors

    Oshima, Azusa
    ;
    Kobayashi, Kazutoshi
    ;
    Kishida, Ryo
    ;
    Komawako, Takuya
    ;
    Weckx, Pieter  
    ;
    Kaczer, Ben  
    Proceedings paper
    2016, 21st International Conference on Simulation of Semiconductor Processes and Process - SISPAD, 13/06/2016, p.327-330

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