Publication:

Physical-based RTN modeling of ring oscillators in 40-nm SiON and 28-nm HKMG by bimodal defect-centric behaviors

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1843 since deposited on 2021-10-23
Acq. date: 2025-10-28

Citations

Metrics

Views

1843 since deposited on 2021-10-23
Acq. date: 2025-10-28

Citations