Browsing by Author "Ota, Kensuke"
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Publication Impact of the filament morphology on the retention characteristics of Cu/Al2O3-based CBRAM devices
Proceedings paper2016, IEEE International Electron Devices Meeting - IEDM, 3/12/2016, p.556-559Publication Kinetic and thermodynamic heterogeneity - an intrinsic source of variability in CBRAM resistive memories
Journal article2017, Journal of Computational Electronics, (16) 4, p.1011-1016