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Impact of the filament morphology on the retention characteristics of Cu/Al2O3-based CBRAM devices
Publication:
Impact of the filament morphology on the retention characteristics of Cu/Al2O3-based CBRAM devices
Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ota, Kensuke
;
Belmonte, Attilio
;
Chen, Zhe
;
Redolfi, Augusto
;
Goux, Ludovic
;
Kar, Gouri Sankar
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Abstract
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1836
since deposited on 2021-10-23
Acq. date: 2025-10-27
Citations
Metrics
Views
1836
since deposited on 2021-10-23
Acq. date: 2025-10-27
Citations