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Browsing by Author "Otten, Ronald"

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    Intra-field mask-to-mask overlay, separating the mask writing from the dynamic pellicle contribution

    van Haren, Richard  
    ;
    Steinert, Steffen
    ;
    Mouraille, Orion
    ;
    D'have, Koen  
    ;
    van Dijk, Leon
    Proceedings paper
    2018, Photomask Japan 2018: XXV Symposium on Photomask and Next-Generation Lithography Mask Technology, 18/04/2018, p.108070K
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    Intra-field stress impact on global wafer deformation

    van Haren, Richard  
    ;
    Otten, Ronald
    ;
    Singh, Subodh
    ;
    Singh, Amandev
    ;
    Van Dijk, Leon
    ;
    Owen, David
    Proceedings paper
    2019, Metrology, Inspection, and Process Control for Microlithography XXXIII, 24/02/2019, p.109591I

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