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Browsing by Author "Pacagnella, A."

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    Threshold voltage instability in CMOS high-K dielectrics: comparison between hafnium and aluminum oxide

    Cimino, S.
    ;
    Pantisano, Luigi
    ;
    Pacagnella, A.
    ;
    Groeseneken, Guido  
    Oral presentation
    2003, 34th IEEE Semiconductor Interface Specialists Conference - SISC

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