Publication:
Threshold voltage instability in CMOS high-K dielectrics: comparison between hafnium and aluminum oxide
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1890 since deposited on 2021-10-15
1last month
Acq. date: 2025-12-15
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Views
1890 since deposited on 2021-10-15
1last month
Acq. date: 2025-12-15
Citations