Browsing by Author "Palenskis, V."
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Publication High frequency RTS noise in submicron MOSFETs
Proceedings paper1996, Proceedings 3rd ELEN Workshop, 5/11/1996, p.144-149Publication Noise and THI reliability indicators for thin film resistors
;Sikula, J. ;Hruska, P. ;Vasina, Petr ;Schauer, P. ;Kolarova, R. ;Hajek, K.Stadalnikas, A.Proceedings paper1996, Proceedings of CARTS-EUROPE'96. 10th European Passive Components Symposium, 7/10/1996, p.200-205