Browsing by Author "Pan, Liyang"
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Publication A proper approach to characterize retention-after-cycling in 3D-Flash devices
Proceedings paper2013, International Conference on Microelectronics Test Structures - ICMTS, 25/03/2013, p.187-191Publication Comprehensive understanding of charge lateral migration in 3D SONOS memories
Journal article2016, Solid-State Electronics, 116, p.95-99