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Browsing by Author "Pantelides, S. T."

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    Publication

    Total ionizing dose effects on strained Ge pMOS FinFETS on bulk Si

    Zhang, E. Z
    ;
    Fleetwood, D. M.
    ;
    Hatchel, J. A.
    ;
    Liang, C.
    ;
    Reed, R.
    ;
    Alles, M. L.
    ;
    Schrimpf, R. D.
    Journal article
    2017, IEEE Transactions on Nuclear Science, (64) 1, p.226-232

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