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Browsing by Author "Pattyn, H."

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    Formation and thermal stability of Nd0.32Y0.68Si1.7 layers formed by channeled ion beam synthesis

    Wu, Ming Fang
    ;
    Vantomme, Andre  
    ;
    Hogg, S.
    ;
    Pattyn, H.
    ;
    Langouche, G.
    ;
    Jin, S.
    ;
    Bender, Hugo  
    Proceedings paper
    1998, Advanced Interconnects and Contact Materials and Processes for Future Integrated Circuits, 13/04/1998, p.191-196
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    Growth of high-quality buried Y- and (Y, Nd)-silicide layers prepared by channelled ion implantation

    Jin, S.
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    Bender, Hugo  
    ;
    Wu, Ming Fang
    ;
    Vantomme, Andre  
    ;
    Hogg, S.
    ;
    Pattyn, H.
    ;
    Langouche, G.
    Journal article
    1998, Journal of Crystal Growth, (194) 2, p.189-194
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    Identification of Sn-V related acceptor levels in irradiated tin-doped n-type silicon

    Simoen, Eddy  
    ;
    Claeys, Cor
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    Neimash, V. B.
    ;
    Kraitchinskii, A.
    ;
    Kras'ko, M.
    ;
    Puzenko, O.
    ;
    Blondeel, A.
    Proceedings paper
    2000, General Scientific Meeting Belgische Natuurkundige Vereniging / Société Belge de Physique, 25/05/2000, p.CM41
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    Ion beam synthesis of buried CoxNi1-xSi2 layers in silicon

    Wu, Ming Fang
    ;
    De Wachter, Jo
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    Van Bavel, Mieke  
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    Pattyn, H.
    ;
    Langouche, G.
    ;
    Vanhellemont, Jan
    Proceedings paper
    1994, Materials Synthesis and Processing Using Ion Beams, 29/11/1993, p.711-716
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    Ion beam synthesis of buried CoxNi1-xSi2 layers in silicon

    Wu, Ming Fang
    ;
    De Wachter, Jo
    ;
    Van Bavel, Mieke  
    ;
    Pattyn, H.
    ;
    Langouche, G.
    ;
    Vanhellemont, Jan
    Proceedings paper
    1994, Silicides, Germanides, and their Interfaces, 29/11/1993, p.159-164
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    Ion beam synthesis of heteroepitaxial erbium silicide layers

    Wu, Ming Fang
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    Vantomme, Andre  
    ;
    Pattyn, H.
    ;
    Langouche, G.
    ;
    Bender, Hugo  
    Journal article
    1996, Applied Surface Science, 102, p.184-188
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    Tin-related deep levels in proton-irradiated n-type silicon

    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Neimash, V. B.
    ;
    Kraitchinskii, A.
    ;
    Kras'ko, M.
    ;
    Puzenko, O.
    ;
    Blondeel, A.
    Proceedings paper
    2000, Proceedings 2nd ENDEASD Workshop, 27/06/2000, p.147-156

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