Browsing by Author "Pavanello, Marcelo"
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Publication Channel length influence on the low-frequency noise of strained 45o rotated triple gate SOI nFinFETs
Proceedings paper2014, 10th Workshop on the Thematic Network on Silicon on Insulator Technology, Devices and Circuits - EUROSOI, 29/01/2014, p.1-2Publication Detailed analysis of transport properties of FinFETs through Y-function method: effects of substrate orientation and strain
Proceedings paper2015, 30th Symposium on Microelectronics Technology and Devices - SBMICRO, 31/08/2015, p.1-4