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Browsing by Author "Pereira, L. M. C."

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    Scanning tunneling microscopy for imaging and quantification of defects in as-deposited MoS2 monolayers on sapphire substrates

    Rybalchenko, Yevhenii  
    ;
    Minj, Albert  
    ;
    Medina Silva, Henry  
    ;
    Villarreal, R.
    ;
    Groven, Benjamin  
    Journal article
    2023, SOLID-STATE ELECTRONICS, 209, p.108781

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