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Browsing by Author "Perry, Daniel"

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    Test structures for characterization of through-silicon vias

    Stucchi, Michele  
    ;
    Perry, Daniel
    ;
    Katti, Guruprasad
    ;
    Dehaene, Wim  
    ;
    Velenis, Dimitrios  
    Journal article
    2012, IEEE Transactions on Semiconductor Manufacturing, (25) 3, p.355-364

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