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    Detecting Transistor Defects in Medical Systems Using a Multi Model Ensemble of Convolutional Neural Networks

    Kocak, Husnu Murat
    ;
    Naskali, Ahmet Teoman
    ;
    Pinarer, Ozgun
    ;
    Mitard, Jerome  
    Proceedings paper
    2021-08, 9th IEEE International Conference on Big Data (IEEE BigData), DEC 15-18, 2021, p.4731-4737

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