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Browsing by Author "Pinel, S."

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    Residual thermo-mechanical stresses in thinned-chip assemblies

    Leseduarte, S.
    ;
    Marco, S.
    ;
    Beyne, Eric  
    ;
    Van Hoof, Rita  
    ;
    Marty, A.
    ;
    Pinel, S.
    ;
    Vendier, O.
    Proceedings paper
    1999, Proceedings of 5th International Workshop on Thermal Investigations of ICs and Microstructures - THERMINIC, 3/10/1999, p.306-311
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    Residual thermomechanical stresses in thinned-chip assemblies

    Leseduarte, S.
    ;
    Marco, S.
    ;
    Beyne, Eric  
    ;
    Van Hoof, Rita  
    ;
    Marty, A.
    ;
    Pinel, S.
    ;
    Vendier, O.
    Journal article
    2000, IEEE Trans. Components and Packaging Technologies, (23) 4, p.673-679
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    Thermal management in a new ultra-thin chip stack technology

    Pinel, S.
    ;
    Tasselli, J.
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    Bailbe, J. P.
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    Marty, A.
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    Marco, S.
    ;
    Morante, J. R.
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    Beyne, Eric  
    ;
    Van Hoof, Rita  
    Proceedings paper
    2001, Proceedings of the 2nd Eurosime Conference; 9-11 April 2001; Paris, France., p.269-276
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    Thermal modeling and management in ultrathin chip stack technology

    Pinel, S.
    ;
    Marty, A.
    ;
    Tasselli, J.
    ;
    Bailbe, J. P.
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    Beyne, Eric  
    ;
    Van Hoof, Rita  
    ;
    Marco, S.
    ;
    Morante, J. R.
    Journal article
    2002, IEEE Trans. Components and Packaging Technologies, (25) 2, p.244-253
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    Ultra thin chip vertical integration technique

    Pinel, S.
    ;
    Tasselli, J.
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    Lepinois, F.
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    Marty, A.
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    Bailbe, J. P.
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    Beyne, Eric  
    ;
    Van Hoof, Rita  
    ;
    Marco, S.
    Proceedings paper
    2001, Conference Proceedings of the 13th European Microelectronics and Packaging Conference & Exhibition; 30 May - 1 June 2001; Stras, p.299-302
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    Ultra thin electronics for space applications

    Vendier, O.
    ;
    Huan, M.
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    Drevofi, C.
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    Cazaux, J. L.
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    Beyne, Eric  
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    Van Hoof, Rita  
    ;
    Marty, A.
    ;
    Pinel, S.
    Proceedings paper
    2001, Proceedings 51st Electronic Components and Technology Conference, 29/05/2001, p.767-771

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