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Browsing by Author "Pintelon, Rik"

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    An iterative method to stabilise a transfer function in the s- and z-domains

    D'Haene, Tom
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    Pintelon, Rik
    ;
    Vandersteen, Gerd  
    Proceedings paper
    2005-05, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, 16/05/2005, p.666-671
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    Analysis and modelling of mixed-data systems with frequency translation

    Bos, Lynn
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    Vandersteen, Gerd  
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    Rolain, Yves
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    Pintelon, Rik
    Proceedings paper
    2008, IEEE International Instrumentation and Measurement Technology Conference - IMTS, 12/05/2008, p.542-546
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    Application of blind identification to nonlinear calibration

    Vanbeylen, Laurent
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    Pintelon, Rik
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    Schoukens, Johan
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    Asymptotic uncertainty of transfer function estimates using non-parametric noise models

    Pintelon, Rik
    ;
    Hong, M.
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    Blind maximum likelihood identification of Wiener systems

    Vanbeylen, Laurent
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    Pintelon, Rik
    Proceedings paper
    2007, Proceedings of the European Conference on Control - ECC, 2/07/2007, p.4625-2632
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    Detection of unmodeled nonlinearities using correlation methods

    Enqvist, M.
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    Schoukens, Johan
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    Pintelon, Rik
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    Enhanced time base jitter compensation of sine waves

    Verbeyst, Frans
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    Rolain, Yves
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    Pintelon, Rik
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    Schoukens, Johan
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    Estimating parameterized scalable models from the best linear approximation of nonlinear systems for accurate high-level simulations

    De Locht, Ludwig
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    Vandersteen, Gerd  
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    Rolain, Yves
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    Pintelon, Rik
    Proceedings paper
    2005-05, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 17/05/2005, p.517-522
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    Estimating scalable common-denominator Laplace-domain MIMO models in an errors-in-variables framework

    Vandersteen, Gerd  
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    De Locht, Ludwig
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    Jenei, Snezana
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    Rolain, Yves
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    Pintelon, Rik
    Proceedings paper
    2005, Proceedings of the Design, Automation and Test in Europe Conference and Exhibition - DATE, 7/03/2005, p.1076-1081
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    Experimental characterization of operational amplifiers: a system identification approach - Part I: Theory and simulations

    Pintelon, Rik
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    Vandersteen, Gerd  
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    De Locht, Ludwig
    ;
    Rolain, Yves
    ;
    Schoukens, Johan
    Journal article
    2004-06, IEEE Trans. Instrumentation and Measurement, (53) 3, p.854-862
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    Experimental characterization of operational amplifiers: a system identification approach - Part II: Calibration and measurements

    Pintelon, Rik
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    Rolain, Yves
    ;
    Vandersteen, Gerd  
    ;
    Schoukens, Johan
    Journal article
    2004-06, IEEE Trans. Instrumentation and Measurement, (53) 3, p.863-876
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    Extended subspace identification of improper linear systems

    Vandersteen, Gerd  
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    Pintelon, Rik
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    Linten, Dimitri  
    ;
    Donnay, Stephane  
    Proceedings paper
    2004, Proceedings Design, Automation and Test in Europe Conference and Exhibition, 16/02/2004, p.454-459
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    Extending the best linear approximation for frequency translating systems: the best mixer approximation

    Vandermot, Koen
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    Van Moer, Wendy
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    Rolain, Yves
    ;
    Pintelon, Rik
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    Extraction of a quantitative reaction mechanism from linear sweep voltammograms obtained on a rotating disk electrode. Part II: Application to the redoxcouple Fe(CN)3-6/Fe(CN)4-6

    Tourwé, Els
    ;
    Breugelmans, Tom
    ;
    Pintelon, Rik
    ;
    Hubin, Annick
    Journal article
    2007, Journal of Electroanalytical Chemistry, (609) 1, p.1-7
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    Faster ESD device characterization with wafer-level HBM

    Scholz, Mirko
    ;
    Tremouilles, David
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    Linten, Dimitri  
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    Rolain, Yves
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    Pintelon, Rik
    Proceedings paper
    2007, 20th IEEE International Conference on Microelectronic Test Structures - ICMTS, 19/03/2007, p.93-96
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    Frequency domain errors-in-variables estimation of linear dynamic systems using data from overlapping sub-records

    Barbé, Kurt
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    Schoukens, Johan
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    Pintelon, Rik
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    Identifying the main nonlinear contributions: Use of multitone excitations during circuit design

    De Locht, Ludwig
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    Vandersteen, Gerd  
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    Wambacq, Piet  
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    Rolain, Yves
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    Pintelon, Rik
    ;
    Schoukens, Johan
    Proceedings paper
    2004-12, 64th ARFTG Microwave Measurement Conference, 30/11/2004, p.75-84
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    Linearization of nonlinear dynamic systems

    Schoukens, Johan
    ;
    Németh, J.G.
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    Vandersteen, Gerd  
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    Pintelon, Rik
    ;
    Crama, Philippe
    Journal article
    2004-08, IEEE Trans. Instrumentation and Measurement, (53) 4, p.1245-1248
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    Measuring the response of a voltage controlled oscillator using the large-signal network analyser

    Rolain, Yves
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    Van Moer, Wendy
    ;
    Pintelon, Rik
    ;
    Schoukens, Johan
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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    Some practical applications of a nonlinear block structure identification procedure

    Lauwers, Lieve
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    Schoukens, Johan
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    Pintelon, Rik
    ;
    Van Moer, Wendy
    ;
    Gommé, Liesbeth
    Proceedings paper
    2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference - IMTC, 1/05/2007
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