Browsing by Author "Privitera, Vittorio"
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Publication Advanced characterization of carrier profiles in germanium using micro-machined contact probes
Proceedings paper2012, Ion Implantation Technology. Proceedings of the 19th International Conference, 25/06/2012, p.167-170Publication Aluminium implantation in germanium: uphill diffusion, electrical activation and trapping
Publication Carrier Distribution in Silicon Devices by Atomic Force Microscopy on Etched Surfaces
Journal article1994, Appl. Phys. Lett., 64, p.354-356Publication DLTS and PL studies of proton radiation defects in TiN-doped FZ silicon
Journal article2002, Nuclear Instruments & Methods in Physics Research B, 186, p.19-23Publication DLTS PL studies of proton radiation defects in tin-doped FZ silicon
Oral presentation2001, Symposium B of the E-MRS Spring Meeting 2001: Defect Engineering of Advanced Semiconductor Devices; June 5-8, 2001; Strasbourg,Publication High-energy proton radiation induced defects in tin-doped N- tType sSilicon
Journal article2001, Physica B, 308-310, p.477-480Publication On the Determination of Two-Dimensional Carrier Distributions
Oral presentation1994, Ion Implantation Technology Conference; June 13-16, 1994; Catania, Italy.Publication On the determination of two-dimensional carrier distributions
Journal article1995, Nuclear Instruments and Methods in Physics Research B, (96) 1_2, p.123-32Publication On the determination of two-dimensional carrier distributions
Proceedings paper1995, 3rd Int. Workshop on the Measurement and Characterizaton of Ultra-Shallow Dopant Profiles in Semiconductors, 20/03/1995, p.41.1-41.19Publication Photoluminescence and deep-level transient spectroscopy study of tin related radiation defects in silicon
Meeting abstract2001, General Scientific Meeting Belgian Physical Society, 16/05/2001, p.CM45Publication Two-dimensional spreading resistance profiling: recent understandings and applications
Journal article1994, J. Vac. Sci. Technol. B, (12) 1, p.276-282Publication Verification of 2D SRP by the Analysis of Known Lateral Profiles
Oral presentation1995, Proceedings of the 3rd International Workshop on the Measurement and Characterization of Ultra-Shallow Doping Profiles in Semico