Browsing by Author "Procel, Luis Miguel"
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Publication A defect-centric analysis of the temperature dependence of the channel hot carrier degradation in nMOSFETs
Journal article2016, IEEE Transactions on Device and Materials Reliability, (16) 1, p.98-100Publication A defect-centric perspective on channel hot carrier variability in nMOSFETs
Journal article2015, Microelectronic Engineering, 147, p.72-74Publication Defect-centric distribution of channel hot carrier degradation in nano-MOSFETs
Journal article2014, IEEE Electron Device Letters, (35) 12, p.1167-1169Publication Experimental evidence of the quantum point contact theory in the conduction mechanism of bipolar HfO2-based resistive random access memories
Journal article2013, Journal of Applied Physics, (114) 7, p.74509