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Browsing by Author "Puzzilli, G."

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    Characterization of charge trapping in SiO2/Al2O3 dielectric stacks by pulsed CV-technique

    Puzzilli, G.
    ;
    Govoreanu, Bogdan  
    ;
    Irrera, F.
    ;
    Rosmeulen, Maarten  
    ;
    Van Houdt, Jan  
    Journal article
    2007-06, Microelectronics Reliability, (47) 4_5, p.508-512

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