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Browsing by Author "Qu, D."

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    Test circuits for fast and reliable assessment if CDM robustness of I/O stages

    Stadler, W.
    ;
    Esmark, K.
    ;
    Reynders, K.
    ;
    Zubeidat, M.
    ;
    Graf, M.
    ;
    Wilkening, W.
    ;
    Willemen, J.
    ;
    Qu, D.
    Journal article
    2005, Microelectronics Reliability, (45) 2, p.269-277

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