Browsing by Author "Qu, D."
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Publication Test circuits for fast and reliable assessment if CDM robustness of I/O stages
;Stadler, W. ;Esmark, K. ;Reynders, K. ;Zubeidat, M. ;Graf, M. ;Wilkening, W. ;Willemen, J.Qu, D.Journal article2005, Microelectronics Reliability, (45) 2, p.269-277